NFC Product Development: Early Troubleshooting Saves Time and Money
COMPRION introduces their new product line for NFC development testing that helps identifying and resolving error causes in NFC communication at an early stage.
On the Embedded World, February 27 – March 1, in Nuremberg, COMPRION – a provider of test solutions – is going to launch their latest product line for NFC testing, the CL Development Line. It can be used for validating the interface design, for preparing the certification, for functional testing, and for verifying interoperability.
NFC problems? Do they still exist?
You could think that a technology like NFC which is not brand-new would meanwhile work smoothly. “But that’s not the case!” says Dr. Michael Jahnich, Development Head for NFC Test Solutions at COMPRION. “We observe recurring problems in the field.“
This has four main reasons: First of all, the market is inundated with new NFC devices and applications. Technologies are melting together. This results in a great number of NFC devices that have not been tested according to universal standards. Secondly, the standards often do not cover everything, because the NFC application demands conformance to its own specifications. Thirdly, closed and in itself functioning NFC systems like, for example, access control or contactless payment are extended by use of the smartphone. This can cause interoperability issues. Finally, when individually tested NFC modules are integrated, for example, into car door handles, terminals, or machines, the used materials may interfere with sensitive NFC fields.
Early testing wins half the battle
“Many of these problems could become real showstoppers and cause expensive recalls. This can be avoided by testing early in the development phase,“ explains Jahnich.
The new CL Development Line has been especially designed for NFC development testing and can be used in the following areas:
§ Pre-conformance testing – reducing expensive test lab hours
§ Functional testing – customized NFC device testing
§ Interoperability testing – finding error causes
§ Design validation – optimizing the design
What’s the solution like?
The CL Development Line is a modular system consisting of different hardware and software components as well as unique antennas and accessories that can be configured to match the particular test case. “You don’t pay for software and features that you don’t use, but only for those that you actually need. On the other hand, the system can also be extended by adding further components so that you can cover other application areas,“ Jahnich is glad.
COMPRION is the worldwide leading manufacturer of test solutions for smart card interfaces, terminals, and smart cards. Covering contact-based and contactless technologies, COMPRION provides their expertise to multiple industries, especially telecommunications, payments, and M2M. Our involvement in several standardization and certification bodies enables us to integrate the latest standards and requirements into our high-quality products. As COMPRION test systems are renowned for the most accurate measurement capabilities, the company serves all top mobile phone, terminal, card and chipset manufacturers as well as mobile network operators and test houses. COMPRION also acts as technological consultant supporting many key players in the market.
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Für den Inhalt der Pressemitteilung ist der Einsteller, COMPRION (Tel.: +49525168590), verantwortlich.
Keywords: NFC, Test Solution, EMVCo, MNO, Testing
Unternehmensprofil: COMPRION GmbH
COMPRION is the worldwide leading manufacturer of test solutions for terminals and smart cards covering
contact-based and contactless technologies. Our standardization activities enable us to integrate the
latest standards into our products. As COMPRION systems are renowned for precise measurement capabilities, the company serves all top handset, card, chipset manufacturers, mobile network operators, and test houses.
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